TY  - RPRT
TI  - Advanced resistivity model for arbitrary magnetization orientation applied to a series of compressive- to tensile-strained (Ga,Mn)As layers
AU  - W. Limmer
AU  - J. Daeubler
AU  - L. Dreher
AU  - M. Glunk
AU  - W. Schoch
AU  - S. Schwaiger
AU  - R. Sauer
PY  - 2008
DO  - 10.1103/physrevb.77.205210
UR  - https://arxiv.org/abs/0802.2635
ID  - 0802.2635
ER  -