TY  - RPRT
TI  - Nanogaps with very large aspect ratios for electrical measurements
AU  - A. Fursina
AU  - S. Lee
AU  - R. G. S. Sofin
AU  - I. V. Shvets
AU  - D. Natelson
PY  - 2008
DO  - 10.1063/1.2895644
UR  - https://arxiv.org/abs/0802.2974
ID  - 0802.2974
ER  -