@misc{indiciae72ea5113bf91,
  title = {Percolation Model Explaining Both Unipolar Memory and Threshold Resistance Switchings in NiO Film},
  author = {S. H. Chang and J. S. Lee and S. C. Chae and S. B. Lee and C. Liu and B. Kahng and D. -W. Kim and T. W. Noh},
  year = {2008},
  doi = {10.1103/physrevlett.102.026801},
  url = {https://arxiv.org/abs/0803.4258},
  note = {Source identifier: 0803.4258}
}