TY  - RPRT
TI  - Diffuse neutron reflectivity and AFM study of interface morphology of an electro-deposited Ni/Cu film
AU  - Surendra Singh
AU  - Saibal Basu
AU  - S. K. Ghosh
PY  - 2008
DO  - 10.1016/j.apsusc.2009.01.030
UR  - https://arxiv.org/abs/0804.0670
ID  - 0804.0670
ER  -