@misc{indiciae707e57319ac8,
  title = {Charge carrier induced lattice strain and stress effects on As activation in Si},
  author = {C. Ahn and S. T. Dunham},
  year = {2008},
  doi = {10.1063/1.2956401},
  url = {https://arxiv.org/abs/0804.3985},
  note = {Source identifier: 0804.3985}
}