TY  - RPRT
TI  - Charge carrier induced lattice strain and stress effects on As activation in Si
AU  - C. Ahn
AU  - S. T. Dunham
PY  - 2008
DO  - 10.1063/1.2956401
UR  - https://arxiv.org/abs/0804.3985
ID  - 0804.3985
ER  -