TY  - RPRT
TI  - Phase and amplitude response of "0.7 feature" caused by holes in silicon one-dimensional wires and rings
AU  - N. T. Bagraev
AU  - N. G. Galkin
AU  - W. Gehlhoff
AU  - L. E. Klyachkin
AU  - A. M. Malyarenko
PY  - 2008
DO  - 10.1088/0953-8984/20/16/164202
UR  - https://arxiv.org/abs/0804.4832
ID  - 0804.4832
ER  -