@misc{indiciae0f60524529eb,
  title = {Electrical stress effect on Josephson tunneling through ultrathin AlOx barrier in Nb/Al/AlOx/Nb junctions},
  author = {Sergey K. Tolpygo and Denis Amparo},
  year = {2008},
  doi = {10.1063/1.2977725},
  url = {https://arxiv.org/abs/0806.3094},
  note = {Source identifier: 0806.3094}
}