TY  - RPRT
TI  - Electrical stress effect on Josephson tunneling through ultrathin AlOx barrier in Nb/Al/AlOx/Nb junctions
AU  - Sergey K. Tolpygo
AU  - Denis Amparo
PY  - 2008
DO  - 10.1063/1.2977725
UR  - https://arxiv.org/abs/0806.3094
ID  - 0806.3094
ER  -