TY  - RPRT
TI  - Analytical Approach to the Local Contact Potential Difference on (001) Ionic Surfaces: Implications for Kelvin Probe Force Microscopy
AU  - Franck Bocquet
AU  - Laurent Nony
AU  - Christian Loppacher
AU  - Thilo Glatzel
PY  - 2008
DO  - 10.1103/physrevb.78.035410
UR  - https://arxiv.org/abs/0807.1431
ID  - 0807.1431
ER  -