@misc{indiciae05bdc275a017,
  title = {Thickness Estimation of Epitaxial Graphene on SiC using Attenuation of Substrate Raman Intensity},
  author = {Shriram Shivaraman and M. V. S. Chandrashekhar and John J. Boeckl and Michael G. Spencer},
  year = {2009},
  doi = {10.1007/s11664-009-0803-6},
  url = {https://arxiv.org/abs/0807.3211},
  note = {Source identifier: 0807.3211}
}