TY  - RPRT
TI  - Thickness Estimation of Epitaxial Graphene on SiC using Attenuation of Substrate Raman Intensity
AU  - Shriram Shivaraman
AU  - M. V. S. Chandrashekhar
AU  - John J. Boeckl
AU  - Michael G. Spencer
PY  - 2009
DO  - 10.1007/s11664-009-0803-6
UR  - https://arxiv.org/abs/0807.3211
ID  - 0807.3211
ER  -