@misc{indiciae68ea81d97562,
  title = {Modeling of the evolution of dielectric loss with processing temperature in ferroelectric and dielectric thin oxide films},
  author = {X. H. Zhu and B. Guigues and E. Defay and M. Aid},
  year = {2008},
  doi = {10.1063/1.2999638},
  url = {https://arxiv.org/abs/0809.2008},
  note = {Source identifier: 0809.2008}
}