TY  - RPRT
TI  - Modeling of the evolution of dielectric loss with processing temperature in ferroelectric and dielectric thin oxide films
AU  - X. H. Zhu
AU  - B. Guigues
AU  - E. Defay
AU  - M. Aid
PY  - 2008
DO  - 10.1063/1.2999638
UR  - https://arxiv.org/abs/0809.2008
ID  - 0809.2008
ER  -