TY  - RPRT
TI  - Fidelity, fidelity susceptibility and von Neumann entropy to characterize the phase diagram of an extended Harper model
AU  - Longyan Gong
AU  - Peiqing Tong
PY  - 2008
DO  - 10.1103/physrevb.78.115114
UR  - https://arxiv.org/abs/0809.3628
ID  - 0809.3628
ER  -