TY  - RPRT
TI  - External noise effects on the electron velocity fluctuations in semiconductors
AU  - D. Persano Adorno
AU  - N. Pizzolato
AU  - B. Spagnolo
PY  - 2008
UR  - https://arxiv.org/abs/0810.0995
ID  - 0810.0995
ER  -