TY  - RPRT
TI  - Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements
AU  - Thibault Candela
AU  - François Renard
AU  - Michel Bouchon
AU  - David Marsan
AU  - Jean Schmittbuhl
AU  - Christophe Voisin
PY  - 2008
DO  - 10.1007/s00024-009-0521-2
UR  - https://arxiv.org/abs/0810.1109
ID  - 0810.1109
ER  -