TY  - RPRT
TI  - Performance Analysis of 60nm gate length III-V InGaAs HEMTs: Simulations vs. experiments
AU  - Neophytos Neophytou
AU  - Titash Rakshit
AU  - Mark S. Lundstrom
PY  - 2008
DO  - 10.1109/ted.2009.2021437
UR  - https://arxiv.org/abs/0810.1540
ID  - 0810.1540
ER  -