@misc{indiciaedbc8e6d5bc17,
  title = {Quantum resistance metrology in graphene},
  author = {A. J. M. Giesbers and G. Rietveld and E. Houtzager and U. Zeitler and R. Yang and K. S. Novoselov and A. K. Geim and J. C. Maan},
  year = {2008},
  doi = {10.1063/1.3043426},
  url = {https://arxiv.org/abs/0810.4064},
  note = {Source identifier: 0810.4064}
}