TY  - RPRT
TI  - Nucleation of interfacial shear cracks in thin films on disordered substrates
AU  - Michael Zaiser
AU  - Paolo Moretti
AU  - Avraam Konstantinidis
AU  - Elias C Aifantis
PY  - 2008
DO  - 10.1088/1742-5468/2009/02/p02047
UR  - https://arxiv.org/abs/0811.3611
ID  - 0811.3611
ER  -