@misc{indiciae5f7586ad3ea6,
  title = {Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy},
  author = {P. Nemes-Incze and Z. Osvath and K. Kamaras and L. P. Biro},
  year = {2008},
  doi = {10.1016/j.carbon.2008.06.022},
  url = {https://arxiv.org/abs/0812.0690},
  note = {Source identifier: 0812.0690}
}