TY  - RPRT
TI  - Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
AU  - P. Nemes-Incze
AU  - Z. Osvath
AU  - K. Kamaras
AU  - L. P. Biro
PY  - 2008
DO  - 10.1016/j.carbon.2008.06.022
UR  - https://arxiv.org/abs/0812.0690
ID  - 0812.0690
ER  -