@misc{indiciae6a0436b36022,
  title = {First-Principles Study on Leakage Current through Si/SiO\$\_2\$ Interface},
  author = {Tomoya Ono},
  year = {2009},
  doi = {10.1103/physrevb.79.195326},
  url = {https://arxiv.org/abs/0812.2773},
  note = {Source identifier: 0812.2773}
}