TY  - RPRT
TI  - First-Principles Study on Leakage Current through Si/SiO$_2$ Interface
AU  - Tomoya Ono
PY  - 2009
DO  - 10.1103/physrevb.79.195326
UR  - https://arxiv.org/abs/0812.2773
ID  - 0812.2773
ER  -