TY  - RPRT
TI  - Rich variety of defects in ZnO via an attractive interaction between O-vacancies and Zn-interstitials
AU  - Yong-Sung Kim
AU  - C. H. Park
PY  - 2008
DO  - 10.1103/physrevlett.102.086403
UR  - https://arxiv.org/abs/0812.4123
ID  - 0812.4123
ER  -