TY  - RPRT
TI  - Electrostatic force microscopy and potentiometry of realistic nanostructured systems
AU  - M. Lucchesi
AU  - G. Privitera
AU  - M. Labardi
AU  - D. Prevosto
AU  - S. Capaccioli
AU  - P. Pingue
PY  - 2009
DO  - 10.1063/1.3082125
UR  - https://arxiv.org/abs/0901.0500
ID  - 0901.0500
ER  -