TY  - RPRT
TI  - The energy scale behind the metallic behaviors in low-density Si-MOSFETs
AU  - Geneviève Fleury
AU  - Xavier Waintal
PY  - 2010
DO  - 10.1103/physrevb.81.165117
UR  - https://arxiv.org/abs/0902.3171
ID  - 0902.3171
ER  -