TY  - RPRT
TI  - Nanoparticle characterization by using Tilted Laser Microscopy: back scattering measurement in near field
AU  - D. Brogioli
AU  - D. Salerno
AU  - V. Cassina
AU  - F. Mantegazza
PY  - 2009
DO  - 10.1364/oe.17.015431
UR  - https://arxiv.org/abs/0902.4163
ID  - 0902.4163
ER  -