TY  - RPRT
TI  - Organic film thickness influence on the bias stress instability in Sexithiophene Field Effect Transistors
AU  - F. V. Di Girolamo
AU  - C. Aruta
AU  - M. Barra
AU  - P. D Angelo
AU  - A. Cassinese
PY  - 2009
DO  - 10.1007/s00339-009-5250-y
UR  - https://arxiv.org/abs/0904.2289
ID  - 0904.2289
ER  -