TY  - RPRT
TI  - First-Principles Study for Evidence of Low Interface Defect Density at Ge/GeO$_2$ Interfaces
AU  - Shoichiro Saito
AU  - Takuji Hosoi
AU  - Heiji Watanabe
AU  - Tomoya Ono
PY  - 2009
DO  - 10.1063/1.3168501
UR  - https://arxiv.org/abs/0904.2474
ID  - 0904.2474
ER  -