@misc{indiciae3d8c78de1922,
  title = {Cryogenic instrumentation for fast current measurement in a silicon single electron transistor},
  author = {T. Ferrus and D. G. Hasko and Q. R. Morrissey and S. R. Burge and E. J. Freeman and M. J. French and A. Lam and L. Creswell and R. J. Collier and D. A. Williams and G. A. D. Briggs},
  year = {2010},
  doi = {10.1063/1.3191671},
  url = {https://arxiv.org/abs/0904.3193},
  note = {Source identifier: 0904.3193}
}