TY  - RPRT
TI  - Temperature dependence of the dielectric permittivity of CaF2, BaF2 and Al2O3: application to the prediction of a temperature dependent van der Waals surface interaction exerted onto a neighbouring Cs (8P{3/2}) atom
AU  - Thierry Passerat De Silans
AU  - Isabelle Maurin
AU  - Pedro Chaves De Souza Segundo
AU  - Solomon Saltiel
AU  - Marie-Pascale Gorza
AU  - Martial Ducloy
AU  - Daniel Bloch
AU  - Domingo De Sousa Meneses
AU  - Patrick Echegut
PY  - 2009
DO  - 10.1088/0953-8984/21/25/255902
UR  - https://arxiv.org/abs/0905.4710
ID  - 0905.4710
ER  -