TY  - RPRT
TI  - Power spectrum analysis with least-squares fitting: Amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers
AU  - Simon F. Norrelykke
AU  - Henrik Flyvbjerg
PY  - 2010
DO  - 10.1063/1.3455217
UR  - https://arxiv.org/abs/0906.1708
ID  - 0906.1708
ER  -