TY  - RPRT
TI  - Influence of quantum-mechanical boundary roughness resistance on copper nanolines
AU  - T. E. Huber
AU  - P. Trottman
AU  - J. B. Halpern
PY  - 2009
UR  - https://arxiv.org/abs/0906.3747
ID  - 0906.3747
ER  -