TY  - RPRT
TI  - Defect induced rigidity enhancement in layered semiconductors
AU  - Zs. Rak
AU  - S. D. Mahanti
AU  - K. C. Mandal
AU  - N. C. Fernelius
PY  - 2009
DO  - 10.1016/j.ssc.2010.04.011
UR  - https://arxiv.org/abs/0906.4495
ID  - 0906.4495
ER  -