TY  - RPRT
TI  - Atomic scale characterization of deformation induced interfacial mixing in a Cu/V nanocomposite wire
AU  - Xavier Sauvage
AU  - Cécile Genevois
AU  - Gérald Da Costa
AU  - Viktor Pantsyrny
PY  - 2009
DO  - 10.1016/j.scriptamat.2009.06.007
UR  - https://arxiv.org/abs/0907.1400
ID  - 0907.1400
ER  -