TY  - RPRT
TI  - Dependence of Band Renormalization Effect on the Number of Copper-oxide Layers in Tl-based Copper-oxide Superconductor using Angle-resolved Photoemission Spectroscopy
AU  - W. S. Lee
AU  - K. Tanaka
AU  - I. M. Vishik
AU  - D. H. Lu
AU  - R. G. Moore
AU  - H. Eisaki
AU  - A. Iyo
AU  - T. P. Devereaux
AU  - Z. X. Shen
PY  - 2009
UR  - https://arxiv.org/abs/0907.2747
ID  - 0907.2747
ER  -