TY  - RPRT
TI  - Radiation Induced Point and Cluster-Related Defects with Strong Impact to Damage Properties of Silicon Detectors
AU  - Ioana Pintiliea
AU  - Gunnar Lindstroem
AU  - Alexandra Junkes
AU  - Eckhart Fretwurst
PY  - 2009
DO  - 10.1016/j.nima.2009.09.065
UR  - https://arxiv.org/abs/0907.3050
ID  - 0907.3050
ER  -