@misc{indiciaee80d85c1891f,
  title = {Detection of a single-charge defect in a metal-oxide-semiconductor structure using vertically coupled Al and Si single-electron transistors},
  author = {L. Sun and B. E. Kane},
  year = {2009},
  doi = {10.1103/physrevb.80.153310},
  url = {https://arxiv.org/abs/0908.2479},
  note = {Source identifier: 0908.2479}
}