TY  - RPRT
TI  - Detection of a single-charge defect in a metal-oxide-semiconductor structure using vertically coupled Al and Si single-electron transistors
AU  - L. Sun
AU  - B. E. Kane
PY  - 2009
DO  - 10.1103/physrevb.80.153310
UR  - https://arxiv.org/abs/0908.2479
ID  - 0908.2479
ER  -