TY  - RPRT
TI  - Influence of the vacuum interface on the charge distribution in V2O3 thin films
AU  - Udo Schwingenschloegl
AU  - Raymond Fresard
AU  - Volker Eyert
PY  - 2009
DO  - 10.1088/1367-2630/11/9/093034
UR  - https://arxiv.org/abs/0909.1335
ID  - 0909.1335
ER  -