TY  - RPRT
TI  - Influence of substrate bias on the structural and dielectrical properties of magnetron-sputtered BaxSr1-xTiO3 thin films
AU  - Tommi Riekkinen
AU  - Jan Saijets
AU  - Pasi Kostamo
AU  - Timo Sajavaara
AU  - Sebastiaan van Dijken
PY  - 2009
DO  - 10.1080/00150190903412358
UR  - https://arxiv.org/abs/0909.1637
ID  - 0909.1637
ER  -