@misc{indiciaec17e7f21431a,
  title = {Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements},
  author = {Shuogang Huang and H. M. Christen and M. E. Reeves},
  year = {2009},
  url = {https://arxiv.org/abs/0909.3579},
  note = {Source identifier: 0909.3579}
}