TY  - RPRT
TI  - Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements
AU  - Shuogang Huang
AU  - H. M. Christen
AU  - M. E. Reeves
PY  - 2009
UR  - https://arxiv.org/abs/0909.3579
ID  - 0909.3579
ER  -