@misc{indiciaefbc8bc2dff8e,
  title = {Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging},
  author = {V. Favre-Nicolin and F. Mastropietro and J. Eymery and D. Camacho and Y. M. Niquet and B. M. Borg and M. E. Messing and L. -E. Wernersson and R. E. Algra and E. P. A. M. Bakkers and T. H. Metzger and R Harder and I. K. Robinson},
  year = {2010},
  doi = {10.1088/1367-2630/12/3/035013},
  url = {https://arxiv.org/abs/0910.5491},
  note = {Source identifier: 0910.5491}
}