TY  - RPRT
TI  - Test of scaling theory in two dimensions in the presence of valley splitting and intervalley scattering in Si-MOSFETs
AU  - A. Punnoose
AU  - A. M. Finkel'stein
AU  - A. Mokashi
AU  - S. V. Kravchenko
PY  - 2009
DO  - 10.1103/physrevb.82.201308
UR  - https://arxiv.org/abs/0910.5510
ID  - 0910.5510
ER  -