TY  - RPRT
TI  - Nonlinear metrology with a quantum interface
AU  - M. Napolitano
AU  - M. W. Mitchell
PY  - 2010
DO  - 10.1088/1367-2630/12/9/093016
UR  - https://arxiv.org/abs/0910.5869
ID  - 0910.5869
ER  -