TY  - RPRT
TI  - Role of defects on the electronic and magnetic properties of CrAs/InAs and CrAs/CdSe half-metallic interfaces
AU  - I. Galanakis
AU  - I. Lekkas
PY  - 2009
DO  - 10.1016/j.jmmm.2010.02.058
UR  - https://arxiv.org/abs/0912.1881
ID  - 0912.1881
ER  -