TY  - RPRT
TI  - Thickness dependence of the critical current density in superconducting films: a geometrical approach
AU  - F. Hengstberger
AU  - M. Eisterer
AU  - H. W. Weber
PY  - 2010
DO  - 10.1063/1.3290254
UR  - https://arxiv.org/abs/1001.1056
ID  - 1001.1056
ER  -