@misc{indiciaeb3e275d4985c,
  title = {Minimal Conformal Technicolor and Precision Electroweak Tests},
  author = {Jared A. Evans and Jamison Galloway and Markus A. Luty and Ruggero Altair Tacchi},
  year = {2010},
  doi = {10.1007/jhep10(2010)086},
  url = {https://arxiv.org/abs/1001.1361},
  note = {Source identifier: 1001.1361}
}